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Preparation and characterization of 33 S samples for 33 S(n,α) 30 Si cross-section measurements at the n_TOF facility at CERN

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author: Thomas Rauscher  Francesco Cerutti  Jiří Kroll  Jaroslaw Perkowski  Alberto Ventura  Alfredo Ferrari  Erich Griesmayer 

Publication date May 2018
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