Characterization of electrical properties in axial Si-Ge nanowire heterojunctions using off-axis electron holography and atom-probe tomography
| Image |  |
|---|---|
| Description | |
| Author/s |
author: Meng Gu |
| Publication date | September 13, 2016 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |