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Ion Trapping and Detrapping in Amorphous Tungsten Oxide Thin Films Observed by Real-Time Electro-Optical Monitoring

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Description article by Rui-Tao Wen et al published 27 June 2016 in Chemistry of Materials
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author: Gunnar A. Niklasson  Michael Morales-Luna  Rui-Tao Wen  Claes-Göran Granqvist  Miguel A Arvizu 

Publication date June 27, 2016
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