The use of electron Rutherford backscattering to characterize novel electronic materials as illustrated by a case study of sputter-deposited NbO x films
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: Xinjun Liu Maarten Vos |
| Publication date | December 2014 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |