Structure characterization of hard materials by precession electron diffraction and automatic diffraction tomography: 6H–SiC semiconductor and Ni1+xTe1embedded nanodomains
| Image |  |
|---|---|
| Description | article published in 2012 |
| Author/s | |
| Publication date | August 1, 2012 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |