Correction to Weakly Trapped, Charged, and Free Excitons in Single-Layer MoS in the Presence of Defects, Strain, and Charged Impurities
| Image |  |
|---|---|
| Description | scholarly article published in ACS Nano |
| Author/s |
author: Takashi Taniguchi Nedjma Bendiab Yannick J Dappe Toai Le Quang Vincent Bouchiat Johann Coraux Laurence Magaud Jean-Yves Veuillen Laëtitia Marty Vladimir Cherkez Felix Herziger Simone Lisi Kenji Watanabe Raul Arenal Goutham Nayak Sudipta Dubey |
| Publication date | October 23, 2018 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |