Elucidating the Role of Molecule–Electrode Interfacial Defects in Charge Tunneling Characteristics of Large-Area Junctions
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| Description | scholarly article by Gyu Don Kong et al published 5 September 2018 in Journal of the American Chemical Society |
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author: Martin Thuo Hyo Jae Yoon Sungnam Park |
| Publication date | September 5, 2018 |
| Language | English |
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