Search filters

High-Resolution Line Width Measurement of Single CdSe Nanocrystals at Long Time Scales

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description
Author/s

author: Paul Mulvaney  Halina Rubinsztein-Dunlop  Daniel E Gómez 

Publication date March 17, 2009
Language
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item