Understanding and Optimization of Hot-Carrier Reliability in Germanium-on-Silicon pMOSFETs
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| Description | scholarly article by Debabrata Maji et al published May 2009 in IEEE Transactions on Electron Devices |
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author: Esteve Amat Felice Crupi Debabrata Maji Gino Giusi Calogero Pace Paolo Magnone V. Ramgopal Rao Montserrat Nafria |
| Publication date | May 2009 |
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