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Surface conductivity of Si(100) and Ge(100) surfaces determined from four-point transport measurements using an analytical N -layer conductance model

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Description scholarly article in Physical Review B, vol. 95 no. 7, February 2017
Author/s

author: Vasily Cherepanov  Sven Just  Bert Voigtländer  Stefan Korte 

Publication date February 27, 2017
Language English
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https://archive.org/details/arxiv-1610.02239

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