Atom-Based RF Electric Field Metrology: From Self-Calibrated Measurements to Subwavelength and Near-Field Imaging
| Image |  |
|---|---|
| Description | scholarly article by Christopher L. Holloway et al published April 2017 in IEEE Transactions on Electromagnetic Compatibility |
| Author/s |
author: Matthew T. Simons |
| Publication date | April 2017 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |