Topographic measurement of buried thin-film interfaces using a grazing resonant soft x-ray scattering technique
| Image |  |
|---|---|
| Description | scholarly article in Physical Review B, vol. 90 no. 24, December 2014 |
| Author/s |
author: Hongping Yan Eliot Gann Harald Ade |
| Publication date | December 15, 2014 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |