Aberration-corrected transmission electron microscopy analyses of GaAs/Si interfaces in wafer-bonded multi-junction solar cells
| Image |  |
|---|---|
| Description | article |
| Author/s |
author: Lothar Houben Stephanie Essig Rafal E. Dunin-Borkowski |
| Publication date | November 2013 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |