Interface trap density metrology from sub-threshold transport in highly scaled undoped Si n-FinFETs
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| Description | scholarly article by Abhijeet Paul et al published 15 December 2011 in Journal of Applied Physics |
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author: Gerhard Klimeck Saumitra Mehrotra Serge Biesemans Giuseppe C. Tettamanzi Sven Rogge Abhijeet Paul Sunhee Lee Nadine Collaert |
| Publication date | December 15, 2011 |
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