Efficient Proximity Probing Algorithms for Metrology
| Image |  |
|---|---|
| Description | scholarly article by Aviv Adler et al published January 2015 in IEEE Transactions on Automation Science and Engineering |
| Author/s |
author: Ken Goldberg |
| Publication date | January 2015 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |