Xpert MTB/RIF Assay as a Substitute for Smear Microscopy in an Intermediate Burden Setting
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| Description | scientific article published on 01 March 2019 |
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author: Sejong Chun J H Lee Soon Pal Suh Soo Hyun Kim Eun Jeong Won Hyun-Seung Lee Hyun Jung Choi Yong-Soo Kwon Seung-Jung Kee |
| Publication date | March 1, 2019 |
| Language | English |
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