Fast inline inspection by Neural Network Based Filtered Backprojection: Application to apple inspection
| Image |  |
|---|---|
| Description | article by Eline Janssens et al published November 2016 in Case Studies in Nondestructive Testing and Evaluation |
| Author/s |
author: Jan Sijbers |
| Publication date | November 2016 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |