Comparison of Models and Whole-Genome Profiling Approaches for Genomic-Enabled Prediction of Septoria Tritici Blotch, Stagonospora Nodorum Blotch, and Tan Spot Resistance in Wheat.
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| Description | scientific article |
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author: Jesse Poland Philomin Juliana Gary C Bergstrom Ravi Prakash Singh Mark E Sorrells Jessica Rutkoski |
| Publication date | July 1, 2017 |
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| Missing/wrong data? | Edit Wikidata item |