Catalytic Scanning Probe Nanolithography (cSPL): Control of the AFM Parameters in Order to Achieve Sub-100-nm Spatially Resolved Epoxidation of Alkenes Grafted onto a Surface
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| Description | scientific article |
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author: Sylvain Clair Mathieu Abel Teodor Silviu Balaban Dmitry A Valyaev Olivier Chuzel Jean-Luc Parrain |
| Publication date | April 13, 2016 |
| Language | English |
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