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Quantifying resistances across nanoscale low- and high-angle interspherulite boundaries in solution-processed organic semiconductor thin films
scientific article published on 5 October 2012
Author/s
author: Stephanie S Lee, Yueh-Lin Loo, Jeffrey M Mativetsky, Marsha A Loth
Work details
Publication date
October 5, 2012
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Language
English
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