Quantifying resistances across nanoscale low- and high-angle interspherulite boundaries in solution-processed organic semiconductor thin films
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| Description | scientific article published on 5 October 2012 |
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author: Marsha A Loth Stephanie S Lee Jeffrey M Mativetsky Yueh-Lin Loo |
| Publication date | October 5, 2012 |
| Language | English |
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| Missing/wrong data? | Edit Wikidata item |