Spherically bent analyzers for resonant inelastic X-ray scattering with intrinsic resolution below 200 meV.
| Image |  |
|---|---|
| Description | scientific article published on 15 June 2005 |
| Author/s |
author: Jean-Luc Pelouard |
| Publication date | June 15, 2005 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |