Quantitative Subsurface Atomic Structure Fingerprint for 2D Materials and Heterostructures by First-Principles-Calibrated Contact-Resonance Atomic Force Microscopy
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| Description | scientific article published on 5 June 2016 |
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author: Qing Tu Volker Blum |
| Publication date | June 5, 2016 |
| Language | English |
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