Electrical impedance tomography reconstruction through simulated annealing with total least square error as objective function.
| Image |  |
|---|---|
| Description | scientific article published in January 2012 |
| Author/s | |
| Publication date | January 1, 2012 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |