Strain measurement at the nanoscale: Comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
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| Description | scientific article published on April 6, 2013 |
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author: Jean-Paul Barnes Armand Béché |
| Publication date | April 6, 2013 |
| Language | English |
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| Access work |
https://api.elsevier.com/content/article/PII:S0304399113000843?httpAccept=text/xml |
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