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Direct measurement of the thickness-dependent electronic band structure of MoS2 using angle-resolved photoemission spectroscopy

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Description scientific article published on 3 September 2013
Author/s

author: James C. Hone  Richard M. Osgood  Jerzy T Sadowski  Po-Chun Yeh  Wencan Jin  Arend M. van der Zande  Irving P. Herman 

Publication date September 3, 2013
Language English
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