Objective characterization of GE Discovery CT750 HD scanner: Gemstone spectral imaging mode
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| Description | scientific article published on March 1, 2011 |
| Author/s |
author: Bob Liu |
| Publication date | March 1, 2011 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Access work |
https://api.wiley.com/onlinelibrary/tdm/v1/articles/10.1118%2F1.3551999 |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |