Ion-beam modification of 2-D materials - single implant atom analysis via annular dark-field electron microscopy.
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| Description | scientific article published on 11 December 2016 |
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author: Eileen Courtney Eoghan O'Connell Ursel Bangert Jhih-Sian Tu Beata Kardynal Quentin Ramasse |
| Publication date | December 11, 2016 |
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