Search filters

Plasma-Enhanced Atomic Layer Deposition of SiN-AlN Composites for Ultra Low Wet Etch Rates in Hydrofluoric Acid.

Image Image of a generic work. The text above it indicates that there is no free image of the work available, and that if you own one, you can click on the placeholder link to upload it.
Description scientific article published on 13 June 2016
Author/s

author: John Provine  Peter Schindler 

Publication date June 29, 2016
Language English
Country of origin
Wikipedia link
Copyright status
Missing/wrong data? Edit Wikidata item