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Investigation of critical shear stress with simultaneous measurement of electrical impedance, capacitance and light backscattering

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Description scientific article published on January 1, 2012
Author/s

author: Sehyun Shin  Byoung Kwon Lee 

Publication date January 1, 2012
Language English
Country of origin
Wikipedia link
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https://content.iospress.com/download?id=10.3233/CH-2011-1526

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