PEALD of SiO2 and Al2O3 thin films on polypropylene: Investigations of the film growth at the interface, stress and gas barrier properties of dyads
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| Description | scientific article published on 17 January 2018 |
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author: Maximilian Gebhard Felix Mitschker Alfred Ludwig Montgomery Jaritz Anjana Devi Rainer Dahlmann Lukas Mai |
| Publication date | January 17, 2018 |
| Language | English |
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