Direct deconvolution approach for depth profiling of element concentrations in multi-layered materials by confocal micro-beam X-ray fluorescence spectrometry
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| Description | scientific article published on April 6, 2013 |
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author: Mateusz Czyżycki Paweł M Wróbel |
| Publication date | April 6, 2013 |
| Language | English |
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https://api.elsevier.com/content/article/PII:S0039914013002737?httpAccept=text/xml |
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