The Origin of Improved Electrical Double-Layer Capacitance by Inclusion of Topological Defects and Dopants in Graphene for Supercapacitors
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| Description | scientific article published on 4 October 2016 |
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author: Hengxing Ji Zonghoon Lee Rodney S. Ruoff |
| Publication date | October 4, 2016 |
| Language | English |
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