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Level Spectrum and Charge Relaxation in a Silicon Double Quantum Dot Probed by Dual-Gate Reflectometry

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Description scientific article published on 12 January 2017
Author/s

author: Patrick Fay  Alessandro Crippa  Andrea Corna 

Publication date January 12, 2017
Language English
Country of origin
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Access work

https://archive.org/details/arxiv-1610.03657

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