Effect of Polarization Reversal in Ferroelectric TiN/Hf0.5Zr0.5O2/TiN Devices on Electronic Conditions at Interfaces Studied in Operando by Hard X-ray Photoemission Spectroscopy
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| Description | scientific article published on 21 November 2017 |
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| Publication date | November 21, 2017 |
| Language | English |
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