Versatile Technique for Assessing Thickness of 2D Layered Materials by XPS.
| Image |  |
|---|---|
| Description | scientific article published on 11 January 2018 |
| Author/s |
author: Dmitri Yu Zemlyanov Kyle C Smith |
| Publication date | January 11, 2018 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |