Improving the Carrier Lifetime of Tin Sulfide via Prediction and Mitigation of Harmful Point Defects.
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| Description | scientific article published on 19 July 2017 |
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author: Moungi Bawendi Robert L. Z. Hoye Juan-Pablo Correa-Baena Lea Nienhaus Cynthia S Lo Niall M Mangan Alex Polizzotti Shaffiq Jaffer Jeremy R. Poindexter Tonio Buonassisi Seong Sik Shin |
| Publication date | July 25, 2017 |
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