Measuring thin films using quantitative frustrated total internal reflection (FTIR).
| Image |  |
|---|---|
| Description | scientific article published on 9 May 2017 |
| Author/s |
author: Minori Shirota Detlef Lohse Michiel A J van Limbeek Chao Sun |
| Publication date | May 9, 2017 |
| Language | |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |