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Individual Atomic Imaging of Multiple Dopant Sites in As-Doped Si Using Spectro-Photoelectron Holography.

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author: Tomohiro Matsushita  Yoshitada Morikawa  Fumihiko Matsui  Kazuo Tsutsui  Toyohiko Kinoshita  Takuya Hoshii 

Publication date December 4, 2017
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