Barrier height measurement of metal contacts to Si nanowires using internal photoemission of hot carriers
| Image |  |
|---|---|
| Description | scientific article published on 18 November 2013 |
| Author/s |
author: Lincoln J Lauhon Iddo Amit |
| Publication date | November 18, 2013 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |