Characterizing the distribution of nonylphenol ethoxylate surfactants in water-based pressure-sensitive adhesive films using atomic-force and confocal Raman microscopy
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| Description | scientific article |
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author: Steven J Severtson Guizhen H Xu Larry E Gwin Carl J Houtman |
| Publication date | September 3, 2008 |
| Language | English |
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