Organic depth profiling of a binary system: the compositional effect on secondary ion yield and a model for charge transfer during secondary ion emission.
| Image |  |
|---|---|
| Description | scientific article published in August 2009 |
| Author/s | |
| Publication date | August 1, 2009 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |