Depth profiling charge accumulation from a ferroelectric into a doped Mott insulator
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| Description | scientific article published on 17 March 2015 |
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author: Manuel Bibes Jean-Pascal Rueff Slavomir Nemsak Agnès Barthélémy Hiroyuki Yamada |
| Publication date | March 17, 2015 |
| Language | English |
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