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Annealing of radiation induced oxygen deficient point defects in amorphous silicon dioxide: evidence for a distribution of the reaction activation energies

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Description scientific article published on August 27, 2008
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author: Simonpietro Agnello 

Publication date August 27, 2008
Language English
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http://stacks.iop.org/0953-8984/20/i=38/a=385215/pdf

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