Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams.
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| Description | scientific article published in October 2009 |
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author: Kazuya Ichiki Yoshihiko Nakata Satoshi Ninomiya Takaaki Aoki Jiro Matsuo Toshio Seki |
| Publication date | October 1, 2009 |
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