Effects of Cryogenic Sample Analysis on Molecular Depth Profiles with TOF-Secondary Ion Mass Spectrometry
| Image |  |
|---|---|
| Description | scientific article published on October 1, 2010 |
| Author/s |
author: Nicholas Winograd John S Fletcher |
| Publication date | October 1, 2010 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Access work | |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |