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X-ray characterization of Ge dots epitaxially grown on nanostructured Si islands on silicon-on-insulator substrates

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Description scientific article published on June 7, 2013
Author/s

author: Yuji Yamamoto 

Publication date June 7, 2013
Language English
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http://journals.iucr.org/j/issues/2013/04/00/xz5001/xz5001.pdf

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