Twin domain imaging in topological insulator Bi2Te3 and Bi2Se3 epitaxial thin films by scanning X-ray nanobeam microscopy and electron backscatter diffraction.
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| Description | scientific article published on 17 February 2017 |
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author: Petr Harcuba Dominik Kriegner Gunther Springholz Andreas Lesnik Jozef Veselý |
| Publication date | February 17, 2017 |
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