Focusing Properties of X-Ray Spectrometers with 2D-Curved Crystals for Extended X-Ray Sources of Hot Plasmas
| Image |  |
|---|---|
| Description | scientific article published on January 1, 1997 |
| Author/s |
author: Schweickhard E. von Goeler |
| Publication date | January 1, 1997 |
| Language | English |
| Country of origin | |
| Wikipedia link | |
| Access work |
https://content.iospress.com/download?id=10.3233/XST-1997-7208 |
| Copyright status | |
| Missing/wrong data? | Edit Wikidata item |