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Secondary ion counting for surface-sensitive chemical analysis of organic compounds using time-of-flight secondary ion mass spectroscopy with cluster ion impact ionization

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Description scientific article published on March 1, 2011
Author/s

author: Kouichi Hirata 

Publication date March 1, 2011
Language English
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https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.3541799/15823895/033101_1_online.pdf

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