Charge exchange recombination detection of low-Z and medium-Z impurities in the extreme UV using a digital lock-in technique
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| Description | scientific article published on October 1, 2010 |
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| Publication date | October 1, 2010 |
| Language | English |
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https://pubs.aip.org/aip/rsi/article-pdf/doi/10.1063/1.3478691/13981579/10d721_1_online.pdf |
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